Authors of papers presented at this conference and within the scope of MDPI Metrology may submit a technically extended version to the Special Issue of Metrology - "Selected Papers from the 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (IEEE MetroXRAINE 2023)".
Submitted manuscripts should not have been previously published, nor be under consideration for publication elsewhere (except conference proceedings papers). Conference papers should be cited and noted on the paper. Please note that submitted extended papers should contain at least 50% new content (e.g., in the form of technical extensions, more in-depth evaluations, or additional use cases) and not exceed 30% copy/paste from the original conference paper.
ABOUT THE JOURNAL
Metrology (ISSN 2673-8244) is an international, peer-reviewed, open access journal that provides the rapid publication of articles covering theory, design, and application in measurement science or measurement technology.
The aim of the journal is to publish high-quality scientific papers with experimental and innovative results at the forefront of knowledge, including major achievements, in the field of metrology.
SPECIAL ISSUE GUEST EDITORS
Egidio De Benedetto, University of Naples Federico II, Italy
Antonio Esposito, University of Naples Federico II, Italy
