Authors of papers presented at this conference and within the scope of MDPI Sensors may submit a technically extended version to the Special Issue of Sensors - "Advanced Sensing and Metrology for eXtended Reality, Artificial Intelligence, and Neural Engineering".

Research and development in eXtended Reality (XR), Artificial Intelligence (AI), and Neural Engineering (NE) are rapidly advancing, supported by progress in sensing systems, computational methods, human–machine interfaces, and data-driven technologies. These fields increasingly rely on heterogeneous data acquired from complex measurement systems, making data quality, reliability, traceability, and uncertainty key requirements for robust and trustworthy applications.

However, measurement-related aspects are still often insufficiently addressed. Sensor performance, calibration, uncertainty evaluation, data quality assessment, and validation procedures are essential to ensure reliable experimental results, comparable system performance, and effective technology transfer. In this context, advanced sensing and applied metrology play a central role in the design, characterization, and optimization of next-generation XR, AI, and NE systems.

This Special Issue, entitled ‘Advanced Sensing and Metrology for eXtended Reality, Artificial Intelligence, and Neural Engineering’, invites original research articles and review papers addressing sensing technologies, measurement methods, and metrological approaches for XR, AI, and NE.

Michael Kuhl, Mittweida University of Applied Sciences, Germany

• kuhl@hs-mittweida.de

Luigi Duraccio, University of Naples Federico II, Italy

• luigi.duraccio@unina.it

Rim Barioul, Chemnitz University of Technology, Germany

• rim.barioul@ieee.org